Riscure announces the availability of a new type of Fault Injection probe, the EM-FI Transient Probe with Adjusting Pulse Width (EM-FI APW). This probe improves the workflow of testing the resilience of chips and devices against Electro-Magnetic Fault Injection attacks. With this method, security teams aim to change the chip’s behavior by creating an electromagnetic field over the chip. The Lab setup for efficient EM-FI testing requires accuracy and flexibility, which is exactly what the latest Riscure probe delivers.
Riscure, a global security advisory lab and market leader in Side Channel Analysis (SCA), has partnered with PQShield, a cybersecurity company specializing in post-quantum cryptography, to evaluate PQShield’s SCA testing and validation processes.