In January 2023 we launched a new product within our Riscure Inspector range that is focused on pre-silicon testing. This release is preceded by years of research, where our goal was to solve a major challenge for chip designers: detect vulnerabilities by simulating hardware designs and find their root cause.
Riscure announces the availability of a new type of Fault Injection probe, the EM-FI Transient Probe with Adjusting Pulse Width (EM-FI APW). This probe improves the workflow of testing the resilience of chips and devices against Electro-Magnetic Fault Injection attacks. With this method, security teams aim to change the chip’s behavior by creating an electromagnetic field over the chip. The Lab setup for efficient EM-FI testing requires accuracy and flexibility, which is exactly what the latest Riscure probe delivers.