Home Webinars Failure Analysis for SCA Thermal Laser Stimulation

Failure Analysis for SCA Thermal Laser Stimulation

Thermal Laser Stimulation (TLS) is a method originating from failure analysis. This method is used to heat up the chip surface with the help of a laser source and as it turns out can help with discovering secrets that are stored in memory on a chip.

In this 12-minute presentation, Our Principal Researcher, Dennis Vermoen will share details about this method and the results that we have achieved. Next to that some of the specific products needed to build a TLS setup will be covered.

This is an on-demand webinar, the recording is available for you any time after registration.

For more information, contact: inforequest@riscure.com