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Optical fault injection on secure Microcontrollers

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Abstract

In this paper we detail the latest developments regarding optical fault injection on secure microcontrollers. On these targets, a combination of countermeasures makes fault injection less than trivial. We develop fault injection methods to show experimentally that protected smart cards are still vulnerable. We perform power signal guided fault injection, using a triggering mechanism based on real-time pattern recognition. Furthermore, the use of jitter-free diode lasers shows current countermeasures may be inadequate for the near future.