Inspector FI
Inspector FI - Fault Injection - offers all features to perform fault injection testing on smart card technology. Two hardware components cover (1) clock and voltage glitching, and (2) optical attacks with laser equipment. Fault injection attacks - also known as perturbation attacks - change the normal behaviour of a chip by inducing an exploitable fault. With Inspector FI, a user can test if he can extract a key by inducing faults in a chip’s cryptographic operations, bypass a check such as an authentication or a lifecycle state, or change the program flow of code on the chip.
Hardware components | |
Flexible smart card glitch device with voltage, clock and laser outputs. It can generate 2 nanosec short pulses. | |
Laser station suitable for accurate multi-glitching on smart cards. | |
Wave form trigger device with built-in analogue filter using real-time correlation pattern matching of any user defined reference pattern. | |
Oscilloscope delivered with Inspector FI. LeCroy WaveRunner series is also supported. |
>> Overview table of Inspector hardware components
Software features | |
Hardware control | Control over the test object, trigger pulse, and oscilloscope. |
Perturbation modules | Pre-configured modules in which the parameters for a fault injection test run are quick and easy to specify. Further, a powerful instruction set to program any new perturbation module. |
DFA cryptanalysis modules | Modules that implement a DFA attack specific for an encryption algorithm. E.g. DFA DES, DFA RSA. |
The Inspector software core with IDE and high-end PC workstation. The source code of all software modules can directly be edited in the Integrated Development Environment. |
How you use Inspector FI
To perform a perturbation test run, the user configures:
- Test object: Inspector generates APDUs to the smart card. This can also be random or selected input message text for DFA. Further, the data on the I/O line is monitored and captured for analysis by the user.
- Trigger: The hardware features a hardware-based trigger to accurately time the injection of faults and to trigger oscilloscope measurements. Instead of this trigger, the icWaves device can also be used. Further, fail safety mechanisms can be configured to minimise the risk of a card rendering unusable.
- Perturbation parameters: Configuration of perturbation parameters on VC Glitcher and Laser Manipulation Station (example).
When performing a test run, Inspector loads a small program with the perturbation parameters on the FPGA of the VC Glitcher. VC Glitcher then injects the faults as instructed via the voltage, clock or laser circuit, and closely monitors the behaviour of the test object. All card behaviour is fed back to Inspector for further analysis by the user.
For performing DFA, dedicated attack modules are available for popular encryption algorithms such as DES, AES and RSA.
Benefits
Inspector FI offers:
- One solution for voltage, clock and laser testing of chip technology.
- Very short pulses produced by flexible glitching hardware
- A powerful instruction set to program any fault injection attack scenario.
- Extensive configuration options to automate fault injection testing
- Multi-glitching laser equipment that is custom-designed for fault injection testing
- DFA modules for implementations of popular encryption algorithms, including RSA, AES and 3DES