Hardware

The device formerly known as the EMA Tracer has been upgraded to the EM Probe Station. The EM Probe Station now includes a motorized XYZ table which is fully integrated with the Inspector software. By automatically scanning a chip's surface with the EM Probe, the leakage characteristics are visualised on screen in three-dimensional representation. After identification of the best spot, an detailed trace set acquisition can be started for further analysis of the cryptographic implementation.

Signal processing

• Spectral Intensity module to automatically analyse scan results from EM Probe Station. With a 3D plot, the user can easily identify the hot spot on the chip's surface on which a detailed analysis can be started by simply clicking the spot in the 3D plot.
• XTalClear filter for automated removal from traces of frequency component that are related to sub and higher harmonics of X-tal stabilized clocks. 

Side channel cryptanalysis

• 2nd order AES cryptanalysis module to analyse AES implementations that make use of data / key masking countermeasures.
• 2nd order (3)DES cryptanalysis module to analyse DES implementations that make use of data / key masking countermeasures.

Software Core

• Addition of a standard menu structure at the top of each window pane to ease navigation.
• Density plot of trace set to enhance trace representation on screen. The techniques used are now the same as offered by high-quality oscilloscopes. In addition, the colour pallet of a trace set has changed to offer more clarity in complex and overlapping traces.
• Moved from software-based to dongle-based licensing.
• Extensive additions to the user manual to assist in EMA.