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Side-channel security testing
Riscure tests a smart card's resistance
against side-channel attacks. In all our evaluations, we heavily
rely on Inspector, our advanced side-channel analysis tool. This
allows us to perform a very detailed analysis in a short period of
time. With Inspector, we test to break the security, not to run a standard set of
tests.
Fault analysis
We apply power glitching and optical laser attacks. Our test lab has equipment
for the generation of glitches of arbitrary length and size, and
analysis tools that automatically derive keys from corrupted
signatures.
Optical attacks with a laser are relatively new. We test a
chip's resistance by tuning variables such as light intensity,
spectrum, timing and location. If needed, we perform optical
analysis in combination with hardware reverse engineering to
identify the weakest location on the chip.
Electromagnetic
Analysis (DEMA)
DEMA is an emerging analysis technique. With specialised sensors and signal analysis
techniques, a chip is tested on susceptibility to key retrieval via
electromagnetic analysis.
SPA and DPA
To conduct SPA (Simple Power Analysis)
and DPA (Differential Power Analysis),
we have extensive knowledge and experience in various attacks on
DES, AES, COMP128* and RSA implementations. We operate a well-equipped
test lab to perform data acquisition, signal processing and
statistical analysis. We developed a special high-order DPA
technique (not published) which has shown that many implementations
are still not resistant against advanced power analysis.
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